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SCIENCE CHINA Information Sciences, Volume 65 , Issue 4 : 149201(2022) https://doi.org/10.1007/s11432-019-2896-x

Industrial process fault detection based on locally linear embedded latent mapping

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  • ReceivedNov 3, 2019
  • AcceptedApr 1, 2020
  • PublishedMar 19, 2021

Abstract

There is no abstract available for this article.


Acknowledgment

This work was supported by National Natural Science Foundation of China (Grant Nos. 61490701, 61673279).


References

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