logo

SCIENCE CHINA Information Sciences, Volume 60 , Issue 8 : 082401(2017) https://doi.org/10.1007/s11432-015-0976-9

Terahertz detector for imaging in 180-nm standard CMOS process

More info
  • ReceivedOct 8, 2016
  • AcceptedNov 21, 2016
  • PublishedFeb 10, 2017

Abstract


Funded by

National Natural Science Foundation of China(61474108)

National Natural Science Foundation of China(61331003)

Beijing Natural Science Foundation(4152051)

National Key Research and Development Program of China(2016YFA0202202)


Acknowledgment

Acknowledgments

This work was supported by National Key Research and Development Program of China (Grant No. 2016YFA0202202), National Natural Science Foundation of China (Grant Nos. 61474108, 61331003), Beijing Natural Science Foundation (Grant No. 4152051), and Chinese Academy of Sciences. The authors are grateful to Prof. H. Qin and Dr. J. D. Sun of Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, for the measurement support.