Research on integrated circuit soft errors based on the China Jinping Underground Laboratory
Abstract
<p indent="0mm">With the advancement of integrated circuit technology, single event effects (SEE) present an increasingly severe challenge to electronic systems in both space and terrestrial applications. Deep underground laboratories, utilizing the natural shielding provided by rock and soil, offer an experimental platform with an extremely low cosmic ray radiation background for SEE research. This environment facilitates the analysis of soft errors caused by alpha particles emitted from the materials of integrated circuits themselves. This review summarizes the progress of real-time measurement experiments on SEE conducted by research teams worldwide in deep underground environments. It also highlights the latest research at the China Jinping Underground Laboratory, including future plans, and analyzes the contribution of soft errors from alpha particles and atmospheric neutrons. By conducting real-time measurements of integrated circuit soft error rates at China Jinping Underground Laboratory, “clean” data and effect characteristics of soft errors caused by alpha particles can be obtained. This provides key data for the establishment of integrated circuit soft error evaluation methods and the enhancement of reliability.</p>
